Hitachi S-4500 Scanning electron Microscope PV7746/32-ME High Take Off Angle 10m

Availability:

1 in stock


$70,650.00

1 in stock

                                                                                                                                                                                                                           Specifications:

Brand/Company: Hitachi

Model: S-4500

Condition: Tested and working

Features:

  • The Hitachi S-4500 emission scanning electron microscope (FESEM) is capable of producing high-resolution images between 20 and 500k.
  • The system is capable of accelerating voltages between 0.5-30 kV.
  • Active image capture and analysis software provided by the revolution 1.6 software allows analytical data and storage.
  • The system is also equipped with an X-ray Dispersive Spectroscopy (EDX) system.

ALLOWED MATERIALS: It must be dry, and stable in vacuum and under electron irradiation.

PROHIBITED MATERIALS: Substances which can outgas/sublime/evaporate in vacuum; hydrocarbons.

CLEANING PROCEDURE: Samples generally do not require cleaning, unless needed to remove prohibited materials before mounting. All materials to enter the SEM will be handled with latex, poly, or nitrile clean gloves –

NO  fingerprints.

HOW TO USE IT:

  • Obtain prepared sample, Bring the SEM to atmospheric pressure in order to open the sample.
  • Put on gloves, while holding the door shut, press and hold the EVAC button until it begins to blink to put the chis up amber back under vacuum.
  • After the 5 minutes is up, you are ready to turn on electron beam and start taking pictures.
  • Adjust the sample height, zoom back out to your desire magnification and if you want to move to another area of your sample, you can X and Y knobs.
  • Turn off the electron beam by clicking the green button that says “no” on the top right corner.
  • Open the sample chamber once the VENT button is sod orange.

 BENEFITS:

The scanning electron microscope has many advantages over a traditional microscope. The SEM has a large depth of field, which allows more of a specimen to be in focus at one time. The SEM also has a much higher resolution, so close space specimens can be magnified at much higher levels.

SKU: 324832612522 Category:
Hitachi S-4500 Scanning electron Microscope 
PV7746/32-ME 
High Take Off Angle 10mm2

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