Bruker The 6th Generation of XFlash Detectors 6-100


1 in stock


1 in stock


The 6th Generation of XFlash® Detectors

XFlash® 6 | 100 – the largest area SDD for low current applications

ƒ 100 mm² active area for special analytical situations
ƒ The ideal choice for low beam current SEMs (cold field emitters) and very sensitive samples

sem-scanning electron microscopy Micro structural analysis for nanoscale materials
electron microscopic studies

Condition and Details:
This is a Used Item in good condition
Not In Original Packing
not Sealed
No Accessories / Cable or probe

Usually we ship same business day, subject to clear funds into our account
Standard order processing time is 4 business days
Item will be packed as per International Standard,
International Orders: DHL / SINGPOST

* Expedited shipping is available for an extra fee.
* International buyers pay all custom, duties, taxes & brokerage fees.

Warranty and Returns:
30 DAYS Money Back or Replacement, buyer pays return shipping.

Product Returns:
Return to Base Warranty Any type of power failure / burn / physical damage / tempered seal will void the warranty.

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Wire-transfer: contact us for payment instructions.
International buyers without PayPal: contact us before bidding.

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SKU: 403877209228 Category:

Bruker The 6th Generation of

XFlash Detectors 6-100

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