The 6th Generation of XFlash® Detectors
XFlash® 6 | 100 – the largest area SDD for low current applications
100 mm² active area for special analytical situations
The ideal choice for low beam current SEMs (cold field emitters) and very sensitive samples
sem-scanning electron microscopy Micro structural analysis for nanoscale materials
electron microscopic studies
Condition and Details:
This is a Used Item in good condition
Not In Original Packing
No Accessories / Cable or probe
Usually we ship same business day, subject to clear funds into our account
Standard order processing time is 4 business days
Item will be packed as per International Standard,
International Orders: DHL / SINGPOST
* Expedited shipping is available for an extra fee.
* International buyers pay all custom, duties, taxes & brokerage fees.
Warranty and Returns:
30 DAYS Money Back or Replacement, buyer pays return shipping.
Return to Base Warranty Any type of power failure / burn / physical damage / tempered seal will void the warranty.
Wire-transfer: contact us for payment instructions.
International buyers without PayPal: contact us before bidding.
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